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Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

✍ Scribed by K. Aimoto; S. Aoyagi; N. Kato; N. Iida; A. Yamamoto; M. Kudo


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
124 KB
Volume
252
Category
Article
ISSN
0169-4332

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