Sputtering by highly charged ions: Application of the XY–TOF technique to secondary ion ejection from LiF

✍ Scribed by J. Lenoir; P. Boduch; H. Rothard; B. Ban-d’Etat; T. Been; A. Cassimi; T. Jalowy; H. Lebius; B. Manil; J.M. Ramillon

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 641 KB
• Volume: 258
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.12.131