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Integrated pin electronics for VLSI functional testers

✍ Scribed by Gasbarro, J.A.; Horowitz, M.A.

Book ID: 119773736
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 719 KB
Volume: 24
Category: Article
ISSN: 0018-9200
DOI: 10.1109/4.18593

No coin nor oath required. For personal study only.

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