𝔖 Bobbio Scriptorium

✦ LIBER ✦

FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits

✍ Scribed by Kuji, N.; Tamama, T.; Nagatani, M.

Book ID: 118698191
Publisher: IEEE
Year: 1986
Tongue: English
Weight: 1007 KB
Volume: 5
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.1986.1270201

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A study on the development of an automat

A study on the development of an automatic fault diagnosis system for testing nuclear power plant digital electronic circuits

✍ Dae Sik Kim; Poong Hyun Seong 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 516 KB

Principal problems in the development of

Principal problems in the development of CAD systems for VLSI circuits for electronic equipment: Batalov, B V, Nemudrov, V G, Sheplev, V A and Kornilov, A ISoviet Microelectron. Vol 16 No 2 (November 1987) pp 105–108

📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 205 KB

[IEEE 13th IEEE Symposium on Design and

[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - A novel SRAM-based FPGA architecture for defect and fault tolerance of configurable logic blocks

✍ Lahrach, Farid; Abdaoui, Abderrazek; Doumar, Abderrahim; Chatelet, Eric 📂 Article 📅 2010 🏛 IEEE ⚖ 336 KB