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[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - A novel SRAM-based FPGA architecture for defect and fault tolerance of configurable logic blocks

✍ Scribed by Lahrach, Farid; Abdaoui, Abderrazek; Doumar, Abderrahim; Chatelet, Eric

Book ID: 118015267
Publisher: IEEE
Year: 2010
Weight: 336 KB
Volume: 0
Category: Article
ISBN: 1424466121
DOI: 10.1109/ddecs.2010.5491763

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