Instrumentation for white beam X-ray diffraction and possible applications
โ Scribed by A.K. Freund
- Publisher
- Elsevier Science
- Year
- 1978
- Weight
- 27 KB
- Volume
- 152
- Category
- Article
- ISSN
- 0029-554X
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๐ SIMILAR VOLUMES
The constraints placed on the design of portable and planetary X-ray diffraction (XRD) instruments by the limited mass, power and volume budgets are very different, in general, to the constraints applicable to laboratory equipment. A relatively simple angle-dispersive, reflection-mode instrument des
The white beam Synchrotron X-Ray Topography (SXRT) technique was used to assess the quality of sapphire wafers grown by the Heat-Exchanger Method (HEM) and the Modified Czochralski Method (MCM). Sapphire is a potential new material for X-ray crystal optics, especially for use as Bragg backscattering