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[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's - Kyoto, Japan (3-6 June 1998)] Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212) - Proton implantation of the power MOSFET to improve its built-in diode reverse recovery

โœ Scribed by Zhu, R.; Chow, T.P.


Book ID
120045269
Publisher
Inst. Electr. Eng. Japan
Year
1998
Tongue
English
Weight
264 KB
Category
Article
ISBN-13
9780780347526

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