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[Inst. Electr. Eng. Japan International Symposium on Power Semiconductor Devices and IC's - Kyoto, Japan (3-6 June 1998)] Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212) - 4.5 kV soft recovery diode with carrier stored structure

✍ Scribed by Satoh, K.; Nakagawa, T.; Morishita, K.; Koga, S.; Kawakami, A.

Book ID: 111863865
Publisher: Inst. Electr. Eng. Japan
Year: 1998
Weight: 339 KB
Volume: 0
Category: Article
ISBN-13: 9780780347526
DOI: 10.1109/ispsd.1998.702696

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