Electron-impact energy-loss spectra near the Si 2p ionization edge in di-, tri-, and tetra-chlorosilane are reported. Term values for excitation to valence-shell orbitals are correlated with attachment energies from electron transmission spectra which identify negative-ion resonances associated with
Inner-shell electron excitation in the methylmethoxysilanes
โ Scribed by D.C. Winkler; J.H. Moore; J.A. Tossell
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 615 KB
- Volume
- 222
- Category
- Article
- ISSN
- 0009-2614
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โฆ Synopsis
The effect of electron-donating substituents on the low-lying unoccupied valence orbit& in the series of silanes Si(CHs),(OCHs).,_, is investigated in an examination of electron-impact energy-loss spectra near the Si 2p ionization edge, and by means of ab initio calculations of the core-hole states populated by the inner-shell excitation. The substituent effect on the LUMO energies, as well as upon the 29Si NMR shieldings, is considered along with the consequences of valence-Rydberg mixing.
๐ SIMILAR VOLUMES
An overview of recently discovered multi-electron excitation effects above several inner-shell X-ray absorption edges is presented. Specific examples of the C1 K L-edge in NH4CIO4 and Br KM-edges in HBr are reported. The general relevance of these phenomena for EXAFS data analysis is emphasized and