๐”– Bobbio Scriptorium
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Electron spectrometry of inner shell excitations

โœ Scribed by R.D. Leapman; V.E. Cosslett


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
316 KB
Volume
26
Category
Article
ISSN
0042-207X

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๐Ÿ“œ SIMILAR VOLUMES


Inner-shell electron excitation in the c
โœ D.C. Winkler; J.H. Moore; J.A. Tossell ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 664 KB

Electron-impact energy-loss spectra near the Si 2p ionization edge in di-, tri-, and tetra-chlorosilane are reported. Term values for excitation to valence-shell orbitals are correlated with attachment energies from electron transmission spectra which identify negative-ion resonances associated with

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The effect of electron-donating substituents on the low-lying unoccupied valence orbit& in the series of silanes Si(CHs),(OCHs).,\_, is investigated in an examination of electron-impact energy-loss spectra near the Si 2p ionization edge, and by means of ab initio calculations of the core-hole states

Double-electron excitation effects above
โœ A. Filipponi ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 251 KB

An overview of recently discovered multi-electron excitation effects above several inner-shell X-ray absorption edges is presented. Specific examples of the C1 K L-edge in NH4CIO4 and Br KM-edges in HBr are reported. The general relevance of these phenomena for EXAFS data analysis is emphasized and