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Inner-shell electron excitation in the chlorosilanes

โœ Scribed by D.C. Winkler; J.H. Moore; J.A. Tossell


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
664 KB
Volume
219
Category
Article
ISSN
0009-2614

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โœฆ Synopsis


Electron-impact energy-loss spectra near the Si 2p ionization edge in di-, tri-, and tetra-chlorosilane are reported. Term values for excitation to valence-shell orbitals are correlated with attachment energies from electron transmission spectra which identify negative-ion resonances associated with electron capture into analogous orbitals. The correlation parameter is a stabilization energy given by the sum of corresponding attachment energies and term values. A previous assumption of the constancy of the stabilization energy across a homologous series is questioned. Ab initio calculations are employed to assign inner-shell excitation features and to reevaluate assignments of electron transmission spectra.


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