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Inherent point defects in thermal biaxially tensile strained-(1 0 0)Si/SiO2 probed by electron spin resonance

✍ Scribed by A. Stesmans; P. Somers; V.V. Afanas’ev; C. Claeys; E. Simoen

No coin nor oath required. For personal study only.

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Inherent point defects in thermal biaxially tensile strained-(1&#xa0;0&#xa0;0)Si/SiO2 probed by electron spin resonance