We examine the possibilities of applying spectroscopic ellipsometry for the determination of the far-infrared dielectric function of high temperature superconductors. On the example of YBa~Cu3Ov at 20 K we show that the potential of the method lies in the accurate determination of e~ rather than the
β¦ LIBER β¦
Infrared studies of high temperature superconductors
β Scribed by Z. Schlesinger; R.T. Collins; D.L. Kaiser; F. Holtzberg; G.V. Chandrashekhar; M.W. Shafer; T.M. Plaskett
- Publisher
- Elsevier Science
- Year
- 1988
- Tongue
- English
- Weight
- 395 KB
- Volume
- 153-155
- Category
- Article
- ISSN
- 0921-4534
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
The use of far-infrared ellipsometry in
β
K. KamarΓ‘s; D. van der Marel; C.C. Homes; T. Timusk
π
Article
π
1994
π
Elsevier Science
π
English
β 207 KB
Infrared studies of high Tc superconduct
β
T. Timusk; M. Reedyk; R. Hughes; D.A. Bonn; J.D. Garrett; J.E. Greedan; C.V. Sta
π
Article
π
1989
π
Elsevier Science
π
English
β 271 KB
Infrared temperature dependent studies o
β
A. Memon; M.N. Khan; S. Al-Dallal; D.B. Tanner
π
Article
π
1994
π
Elsevier Science
π
English
β 291 KB
Noise mechanisms of high temperature sup
β
Ali E. Khalil
π
Article
π
1991
π
Elsevier Science
π
English
β 541 KB
Far infrared behavior of thin film high
β
S.W. McKnight; R.H. Thorland; S. Perkowitz
π
Article
π
1977
π
Elsevier Science
π
English
β 215 KB
Far-infrared spectra of Nd-based high te
β
B.P. Clayman; S.H. Wang; Q. Song
π
Article
π
1990
π
Elsevier Science
π
English
β 320 KB
Reflectance spectra of polycrystalline n-type ceramic superconductors Nd(1.8S)R(0.15)CuO(4-y) (R = Ce and Th) were measured over the range from 2 K to 300 K from 20 cm-~to 10,000 cm-~. The overall reflectivity is interpretted, with the assistance of Kramers-Kronig analysis, as due primarily to free-