The use of far-infrared ellipsometry in the study of high-temperature superconductors: possibilities and limitations

✍ Scribed by K. Kamarás; D. van der Marel; C.C. Homes; T. Timusk

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 207 KB
• Volume: 235-240
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(94)91767-1

✦ Synopsis

We examine the possibilities of applying spectroscopic ellipsometry for the determination of the far-infrared dielectric function of high temperature superconductors. On the example of YBa~Cu3Ov at 20 K we show that the potential of the method lies in the accurate determination of e~ rather than the details of the onset of c~.