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Infra-red, X-ray photoelectron spectroscopy and electrical studies of r.f. sputtered amorphous silicon carbide films

✍ Scribed by L.J. Han; T.Y. Ong; S. Prakash; L.G. Chua; W.K. Choi; L.S. Tan; F.C. Loh; K.L. Tan

No coin nor oath required. For personal study only.

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