Influence of thermal treatments on the distribution of contaminating copper near the surface of silicon: a comparative SIMS and XPS study
β Scribed by D. Ballutaud; P. de Mierry; M. Aucouturier; E. Darque-Ceretti
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 611 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0169-4332
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