The scanning microscope for semiconductor characterization (SMSC): Comparative study of the influence of surface defects on the photoelectrochemical behavior of n-WSe2 and n-MoSe2 layered compounds

✍ Scribed by A.M. Chaparro; P. Salvador; A. Mir

• Publisher: Elsevier
• Year: 1996
• Tongue: English
• Weight: 585 KB
• Volume: 411
• Category: Article
• ISSN: 1572-6657
• DOI: 10.1016/0022-0728(96)04571-8