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Influence of the substrate on the degradation of irradiated Si diodes

✍ Scribed by Ohyama, H. ;Vanhellemont, J. ;Simoen, E. ;Claeys, C. ;Takami, Y. ;Hayama, K. ;Hakata, T. ;Sunaga, H. ;Kobayashi, K.

Publisher
John Wiley and Sons
Year
1996
Tongue
English
Weight
528 KB
Volume
156
Category
Article
ISSN
0031-8965

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