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Influence of the semiconductor-oxide interlayer on the AC-behaviour of InSb MOS-capacitors

✍ Scribed by A. Heime; H. Pagnia

Publisher: Springer
Year: 1978
Tongue: English
Weight: 449 KB
Volume: 15
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf00896894

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