✦ LIBER ✦
Effect of RPT/furnace processing on the minority carrier lifetime in very thin oxide MOS capacitors
✍ Scribed by L. Fonseca; F. Campabadal
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 199 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0038-1101
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