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Influence of the Primary Ion Beam on the Depth Distribution of Implanted Atoms Measured by SIMS

โœ Scribed by Sielanko, J.

Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
244 KB
Volume
112
Category
Article
ISSN
0031-8965

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## Abstract There are reports in the literature that crystal orientation is a major source of variation in sputter yields when examining biomineralized tissue material. To examine this further, single crystals of fluorapatite and calcite, both mineralogical analogues, were examined with two differe