Interdiffusion processes in PbTe/PbTe/PbSe heterostructures were studied. Chalcogen diffusion coefficients were calculated from Se and Te concentration depth profiles recorded by the sputtered neutrals mass spectrometry technique. The deposition of the PbTe layer on the PbTe substrate reduces the ra
β¦ LIBER β¦
Influence of the electrode boundary motion on the determination of the interdiffusion coefficient by electrochemical techniques
β Scribed by F. Lantelme
- Publisher
- Elsevier Science
- Year
- 1985
- Weight
- 940 KB
- Volume
- 196
- Category
- Article
- ISSN
- 0022-0728
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