Influence of the Depletion Zone on EBIC Charge Collection Imaging of Localized Defects in Semiconductors

✍ Scribed by Tarento, R. J. ;Mekki, D. E.

• Publisher: John Wiley and Sons
• Year: 1991
• Tongue: English
• Weight: 268 KB
• Volume: 123
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2211230123