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Influence of post deposition annealing on Y2O3-gated GaAs MOS capacitors and their reliability issues

✍ Scribed by P.S. Das; A. Biswas

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Effects of low temperature annealing on

✍ J.A. Ng; Y. Kuroki; N. Sugii; K. Kakushima; S.-I. Ohmi; K. Tsutsui; T. Hattori; 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 346 KB

Influence of post-deposition annealing o

✍ Joo Han Kim; Kyung Ho Yoon 📂 Article 📅 2008 🏛 Springer US 🌐 English ⚖ 640 KB