Influence of annealing in N2 on the prop
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Limei Lin; Fachun Lai; Yan Qu; Rongquan Gai; Zhigao Huang
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Article
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2007
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Elsevier Science
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English
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In 2 O 3 :Sn (ITO) films were deposited on quartz substrates by direct current magnetron sputtering and annealed in N 2 at temperatures ranging from 150 to 350 โข C for 1 h. The structure and morphology of the films were investigated by X-ray diffraction and atomic force microscopy. The results demon