Influence of multiple scattering on energy loss stragglings for electrons
β Scribed by C.M. Kwei
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 386 KB
- Volume
- 111
- Category
- Article
- ISSN
- 0040-6090
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π SIMILAR VOLUMES
The electronic properties of I n P as an endpoint of the technologically relevant quaternary system InzGal-zAsuP1-y got a renewed interest. This led t o the very accurate determination of the dielectric function E ( E ) = cl(E)
An investigation has been made into the effect of chromatic aberrations of a pre-spectrometer lens system on quantitative elemental analysis by electron energy loss spectroscopy (EELS). In transmission electron microscopy (TEM) diffraction mode, the measured effects are typically 150-330 times large
## Influence of Film Structure on the Electron Energy Loss Spectra of GaAs Thin Films Energy loss nieasurements of fast electrons on GaAs yielded values for the plasma 0scillation, interband transitions and the dielectric function in the region 5 -30 ev. The results are discussed in comparison wit