The electronic properties of I n P as an endpoint of the technologically relevant quaternary system InzGal-zAsuP1-y got a renewed interest. This led t o the very accurate determination of the dielectric function E ( E ) = cl(E)
The influence of lens chromatic aberration on electron energy-loss spectroscopy quantitative measurements
β Scribed by Ying-Ying Yang; Raymond F. Egerton
- Publisher
- John Wiley and Sons
- Year
- 1992
- Tongue
- English
- Weight
- 654 KB
- Volume
- 21
- Category
- Article
- ISSN
- 1059-910X
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β¦ Synopsis
An investigation has been made into the effect of chromatic aberrations of a pre-spectrometer lens system on quantitative elemental analysis by electron energy loss spectroscopy (EELS). In transmission electron microscopy (TEM) diffraction mode, the measured effects are typically 150-330 times larger than if only objective-lens chromatic aberration were important. We discuss several methods of avoiding errors arising from chromatic aberration, including selection of a suitable optical mode (dependent on the desired spatial resolution), adjustment of the TEM imaging system so as to focus the system for a chosen energy loss, and analysis of a large area of a uniform specimen.
π SIMILAR VOLUMES
## Influence of Film Structure on the Electron Energy Loss Spectra of GaAs Thin Films Energy loss nieasurements of fast electrons on GaAs yielded values for the plasma 0scillation, interband transitions and the dielectric function in the region 5 -30 ev. The results are discussed in comparison wit