Defect structure of silicon crystals imp
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Shalimov, Artem ;Shcherbachev, Kirill D. ;Bak-Misiuk, Jadwiga ;Misiuk, Andrzej
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Article
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2007
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John Wiley and Sons
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English
⚖ 517 KB
## Abstract Si(001) single crystal was implanted with hydrogen ions with energy 135 keV and dose 5 × 10^16^ cm^–2^. After implantation, Si:H samples were annealed at 450 and 650 °C under atmospheric and enhanced hydrostatic pressure (1.1 GPa). Defect structure of as‐implanted and processed Si:H was