Impedance measurements and photocurrent spectroscopy have been used to examine the dependence on growth rate of the solid state properties of thin ( -c 20 nm) anodic oxide films on titanium. At room temperature, the relative permittivity and defect concentration profiles in the oxide were found to d
Influence of growth rates on properties of InN thin films
โ Scribed by Yuichi Sato; Susumu Sato
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 205 KB
- Volume
- 146
- Category
- Article
- ISSN
- 0022-0248
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