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Influence of combined AFM/current measurement on local electronic properties of silicon thin films

✍ Scribed by B. Rezek; T. Mates; E. Šı́pek; J. Stuchlı́k; A. Fejfar; J. Kočka


Book ID
117145477
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
222 KB
Volume
299-302
Category
Article
ISSN
0022-3093

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