Characterization of Laser Patterned a-Si:H Thin Films by Combined AFM/Local Current Measurements

✍ Scribed by Rezek, B. ;Stuchlík, J. ;Fejfar, A. ;Kočka, J. ;Nebel, C.E. ;Stutzmann, M.

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 138 KB
• Volume: 170
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199811)170:1<r1::aid-pssa99991>3.0.co;2-7