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Influence of Back-Gate Bias and Process Conditions on the Gamma Degradation of the Transconductance of MuGFETs

✍ Scribed by Put, Sofie; Simoen, Eddy; Collaert, Nadine; De Keersgieter, An; Claeys, Corneel; Van Uffelen, Marco; Leroux, Paul

No coin nor oath required. For personal study only.

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