Accurate modeling of the influence of back gate bias and interface roughness on the threshold voltage of nanoscale DG MOSFETs

✍ Scribed by Biswas, Abhijit; Bhattacherjee, Swagata

• Book ID: 118745730
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 625 KB
• Volume: 53
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2012.09.005