Influence of atomic mixing and preferential sputtering on depth profiles and interfaces
- Book ID
- 104265261
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 162 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0042-207X
No coin nor oath required. For personal study only.
β¦ Synopsis
Classified abstracts 4523-4531 substrate are minimal. Photoresist images are not degraded, and subsequent lift-off is facilitated., S M Kane and K Y Ahn, J Yuc Sci Tecl~ol, 16 (2). 1979, 171-174.
π SIMILAR VOLUMES
## Abstract To study the factors limiting the depth resolution of sputter depth profiling, we have examined the influence of ion mixing, ion beamβinduced roughness and temperature on the interface resolution of metallic bilayers consisting of Pt on top of Ni or Ti. We studied Pt/Ni and Pt/Ti interf
Sputtering-induced surface roughness is the main source of degradation of the depth resolution observed during depth proΓling of polycrystalline metals. Atomic force microscopy (AFM) images of polycrystalline Al Γlms at di β erent mean sputtered depths are used to calculate both the depth distributio