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The influence of growth temperature and annealing on the magnetization depth profiles across ferromagnetic/semiconductor interfaces

✍ Scribed by Park, S.; Fitzsimmons, M. R.; Majkrzak, C. F.; Schultz, B. D.; Palmstro̸m, C. J.

Book ID
121328312
Publisher
American Institute of Physics
Year
2008
Tongue
English
Weight
619 KB
Volume
104
Category
Article
ISSN
0021-8979

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