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Influence of annealing on the structural and magnetic properties of epitaxial Zn1–xMnxO films grown by MOCVD on sapphire

✍ Scribed by E. Chikoidze; H. J. von Bardeleben; Y. Dumont; F. Jomard; O. Gorochov

Publisher
John Wiley and Sons
Year
2006
Tongue
English
Weight
331 KB
Volume
3
Category
Article
ISSN
1862-6351

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✦ Synopsis

Abstract

Thermal annealing of MOCVD grown Zn~1–x~Mn~x~O layers between 300 °C and 1000 °C in an oxygen atmosphere modifies both their latttice parameters and their magnetic properties. Combined X‐ray diffraction and EPR studies indicate a redistribution of intrinsic defects but persistent antiferromagnetic phase in the annealed films. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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Laue oscillations) appear close to the high-angle reflections. The film thickness can then be evaluated as: where W i and W i-1 are positions of adjacent satellite maxima.