✦ LIBER ✦

Incorporation of phosphorus and boron in amorphous silicon measured with (p, γ) resonant reactions

✍ Scribed by M.J.M. Pruppers; F. Zijderhand; K.M.H. Maessen; J. Bezemer; F.H.P.M. Habraken; W.F. Van der Weg

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Depth profiles of boron in IPI amorphous

✍ Liao Changgeng; Zheng Zhilao; Wang Yongqiang; Jiang Bianying 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 193 KB

Doping of Silicon with Phosphorus Using

✍ Heredia-Avalos, Santiago ;Garcia-Molina, Rafael ;Abril, Isabel ;Kalashnikov, Nic 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 207 KB

Concentration profiling of nitrogen in s

✍ Liao Changgeng; Wang Yongqiang; Xiang Jinzhong; Ma Zhihui; Zheng Zhihao 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 188 KB

The implanted profiles of boron, phospho

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 206 KB

Measurement of differential cross-sectio

✍ Pritty Rao; Sanjiv Kumar; S. Vikramkumar; V.S. Raju 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 571 KB

The measurement of the diffusion of phos

✍ H. A. Das; F. H. M. Spit 📂 Article 📅 1987 🏛 Springer 🌐 English ⚖ 373 KB