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In situ X-ray diffraction investigation of porous silicon strains induced by the freezing of a confined organic fluid

✍ Scribed by C. Faivre; D. Bellet; G. Dolino

Book ID: 118791060
Publisher: Springer
Year: 2000
Tongue: English
Weight: 181 KB
Volume: 16
Category: Article
ISSN: 1434-6036
DOI: 10.1007/s100510070202

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