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In-situ spectroscopic study of the As and Te on the Si (112) surface for high-quality epitaxial layers

โœ Scribed by M. Jaime-Vasquez; M. Martinka; R. N. Jacobs; M. Groenert


Book ID
107453791
Publisher
Springer US
Year
2006
Tongue
English
Weight
266 KB
Volume
35
Category
Article
ISSN
0361-5235

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