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In-situ pyrometric interferometry monitoring of In0.5Ga0.5PIn0.5Al0.5P material systems during gas-source molecular beam epitaxy growth

✍ Scribed by D.L. Sato; H.P. Lee; J.M. Kuo; H.C. Kuo

Publisher: Elsevier Science
Year: 1996
Tongue: English
Weight: 282 KB
Volume: 164
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(95)01022-x

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