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In-situ nanoindentation in the SEM

โœ Scribed by Julia D. Nowak; Karolina A. Rzepiejewska-Malyska; Ryan C. Major; Oden L. Warren; Johann Michler

Book ID
104419288
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
317 KB
Volume
12
Category
Article
ISSN
1369-7021

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## Abstract The purpose of this article is to present the design and capabilities of two in situ scanning electron microscope (SEM) indentation instruments covering a large load range from ฮผN to N. The capabilities and advantages of in situ SEM indentation are illustrated by two applications: inden