We describe in detail, the design, construction, and testing of a specimen holder that allows for the nanoindentation of surfaces while viewing in cross-section in a high voltage transmission electron microscope (TEM). This nanoindentation specimen holder, having three-axis position control of a dia
โฆ LIBER โฆ
Quantitative in situ nanoindentation in an electron microscope
โ Scribed by Minor, A. M.; Morris, J. W.; Stach, E. A.
- Book ID
- 121685261
- Publisher
- American Institute of Physics
- Year
- 2001
- Tongue
- English
- Weight
- 547 KB
- Volume
- 79
- Category
- Article
- ISSN
- 0003-6951
No coin nor oath required. For personal study only.
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