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In situ monitoring of electrostriction in anodic and thermal silicon dioxide thin films

✍ Scribed by Blaffart, FrÃ©dÃ©ric; Overmeere, Quentin; Pardoen, Thomas; Proost, Joris

Book ID: 120489489
Publisher: Springer
Year: 2013
Tongue: English
Weight: 394 KB
Volume: 17
Category: Article
ISSN: 1432-8488
DOI: 10.1007/s10008-013-2036-0

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