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In-situ monitoring by spectroscopic ellipsometry in ZnSe crystal growth by molecular beam epitaxy

โœ Scribed by Keishi Kato; Fujio Akinaga; Tsutomu Kamai; Mitsugu Wada

Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
399 KB
Volume
138
Category
Article
ISSN
0022-0248

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