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In situ measurements of the critical thickness for strain relaxation in AlGaN∕GaN heterostructures

✍ Scribed by Lee, S. R.; Koleske, D. D.; Cross, K. C.; Floro, J. A.; Waldrip, K. E.; Wise, A. T.; Mahajan, S.

Book ID
120833952
Publisher
American Institute of Physics
Year
2004
Tongue
English
Weight
446 KB
Volume
85
Category
Article
ISSN
0003-6951

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