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Determination of the critical layer thickness in the InGaN/GaN heterostructures

✍ Scribed by Parker, C. A.; Roberts, J. C.; Bedair, S. M.; Reed, M. J.; Liu, S. X.; El-Masry, N. A.

Book ID: 120081641
Publisher: American Institute of Physics
Year: 1999
Tongue: English
Weight: 493 KB
Volume: 75
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.125146

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