✦ LIBER ✦

In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: experiments (Part II)

✍ Scribed by Sagnard, F.; Bentabet, F.; Vignat, C.

Book ID: 114629880
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 509 KB
Volume: 54
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.2005.847199

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

In situ measurements of the complex perm

In situ measurements of the complex permittivity of materials using reflection ellipsometry in the microwave band: theory (part I)

✍ Sagnard, F.; Bentabet, F.; Vignat, C. 📂 Article 📅 2005 🏛 IEEE 🌐 English ⚖ 701 KB

Reflection and transmission ellipsometry

Reflection and transmission ellipsometry data analysis for measuring the complex permittivity of a single-layer material at microwave frequencies

✍ F. Sagnard; D. Seetharamdoo; V. Le Glaunec 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 254 KB

## Abstract For in situ measurement of the complex permittivity of planar materials, a free‐space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50°]. Original numerical me

Determination of the complex permittivit

Determination of the complex permittivity of materials with transmission/reflection measurements in rectangular waveguides

✍ Serkan Şimşek; Cevdet Işık; Ercan Topuz; Bayram Esen 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 193 KB

Accurate determination of the complex pe

Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides

✍ Catala-Civera, J.M.; Canos, A.J.; Penaranda-Foix, F.L.; de los Reyes Davo, E. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 613 KB

Measurement of the complex refractive in

Measurement of the complex refractive index of liquids in the infrared using spectroscopic attenuated total reflection ellipsometry: correction for depolarization by scattering

✍ den Boer, J. H. W. G. ;Kroesen, G. M. W. ;de Hoog, F. J. 📂 Article 📅 1995 🏛 The Optical Society 🌐 English ⚖ 214 KB

On the measurement of the complex permit

On the measurement of the complex permittivity of layers embedded in a multilayered dielectric material with the use of a free-space method

✍ Israel Garcia-Ruiz; Carlos D. Aviles-Castro; Hildeberto Jardón-Aguilar; Juan Gue 📂 Article 📅 2002 🏛 John Wiley and Sons 🌐 English ⚖ 218 KB

## Abstract Free‐space method approaches for obtaining the complex permittivity of dielectric layers embedded in a multilayer dielectric material are investigated. Solids, liquids, and granular materials have been tested; a description of the de‐embedding process is presented in detail, as are the