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In-situ measurements of magnetic field effects in sub-micron high-electron-mobility transistors

✍ Scribed by Eric R. Mueller; Robert H. Caverly

Publisher: Elsevier Science
Year: 1990
Tongue: English
Weight: 343 KB
Volume: 33
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(90)90212-w

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