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In situ measurement of thickness dependent electrical resistance of ultrathin Co films on SiO[sub 2]/Si(111) substrate

✍ Scribed by M. Li; Y. Zhao; G. Wang

Book ID: 121850119
Publisher: AVS (American Vacuum Society)
Year: 2000
Tongue: English
Weight: 306 KB
Volume: 18
Category: Article
ISSN: 0734-2101
DOI: 10.1116/1.1314390

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