Thickness-dependent coercivity of ultrathin Co films on a rough substrate: Cu-buffered Si(111)

✍ Scribed by H.-G. Min; S.-H. Kim; M. Li; J.B. Wedding; G.-C. Wang

• Book ID: 117217938
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 242 KB
• Volume: 400
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(97)00837-6